COSC 4346 - Digital Circuit Testing
Instructor: Osman
Abou-Rabia
e-mail: osman@cs.laurentian.ca
Office: FA-376 Extension: 2339
Prerequisites: COSC 3426 (Digital Design)
Course Notes: The lectures will be
supplemented
by hardcopy handouts, which will be distributed in class over the
course
of the term.
Books on Testing:
Testing of Digital Systems, Jha and Gupta,
Cambridge University Press, 2003.
Essentials of Electronic Testing for Digital,
Memory &
Mixed-Signal VLSI Circuits, M. Bushnell, and V.D. Agrawal, Kluwer
Academic
Publishers, 2000.
Digital Circuit Testing and Testability, P. Lala,
Academic
Press, 1997.
Digital Systems Testing and Testable
Design,
Miron
Abramovici, Melvin A. Breuer, Arthur D. Friedman, Computer Science
Press,
1990.
Fault Diagnosis of Digital Circuits, IArmolic,
V.N., John Wiley, 1990.
All 5 books are available on reserve at the
J.N. Desmarais
Library
Course Outline:
- Introduction to Testing and Design for
Testability
- Physical Defects and Fault Models
- Fault Equivalence and Fault Dominance
- Combinational Logic Testing Algorithm
a) stuck-at-faults
b) bridging faults
c) delay faults - Fault
Simulation Algorithms
- PLA Testing
- Sequential Logic Testing
- Testing of Sequential Circuits Modelled as a FSM
- Memory Testing
- Design for Testability (DFT)
- Built-In Self-Test (BIST)
- Fault Diagnosis
Evaluation Scheme:
| Assignments |
25% |
| Midterm (Feb. 16/2012) |
30% |
| Final Exam |
45% |
Journals on Testing:
Design and Test of Computers, IEEE
Computer Society
Journal
of Electronic Testing: Theory and Applications , Kluwer Academic
Publisher
IEEE Transactions on Computers
IEEE Transactions on Computer-Aided Design
Conference on Testing:
International Test Conference (IEEE)
Design Automation Conference (ACM/IEEE)
International Conference on Computer-Aided Design (IEEE)
VLSI Test Symposium (IEEE)
International Fault Tolerant Computing Symposium (IEEE)